Minutes, IBIS Quality Committee

06 April 2010

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
  Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lijun, Huawei
  Lynne Green, Green Streak Programs
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
  Moshiul Haque, Micron Technology
  Muniswarareddy Vorugu, ARM Ltd
  Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Tim Coyle, Signal Consulting Group
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for opens and IBIS related patent disclosures:

- No one declared a patent.

- Eckhard mentioned an email from Colin Warwick about crowd-sourcing
  - Lance: It will not work
    - Companies will not assign people to update the models
  - Mike: Companies want us going to their web page
  - Bob: We should not take up this project
    - If someone else does it that's fine
  - Eckhard: It appeared only on IBIS

AR Review:

- Bob send updated IBIS Correlation outline to Mike
  - Done
- Mike post updated IBIS Correlation outline to IQ web
  - Done

New items:

Eckhard: Should we have differential input correlation?
- Mike: Do we want to check IBIS data against the data it was extracted from?
- Lance: Accuracy goes down when a different common mode voltage is used
- Mike: The test we correlate to should be "real world"
- Lance: Bob mentioned the problem of non-linear loads some time ago
- Mike: Moshiul said that he likes checking ODT
- Eckhard: Moshiul was talking about driver I/V

Mike: What do we want for top level organization?
- Our outline may have too much Measurement before Correlation
- Bob: This looks like the Accuracy Handbook
- Mike: The correlation should be against an IBIS simulation
  - It should not be a double-check of the extraction
- Bob: FSV is the really new part here
  - There are special issues with differential too
- Mike: We should discuss Correlation first
- Bob: Agree

Review of sections under Correlation
- Mike: Should FSV be split into 2 categories?
  - Frequency domain FSV
  - Voltage and time domain FSV
- Bob: FSV has an IEEE standard for the frequency domain approach
- Mike: The frequency domain approach is nice
  - It is easy to do
  - Eyeballing voltages usually only compares low frequency content

Mike: Correlation ii through v could be moved to Measurement and Simulation
- Section 3 could be seen as "How to Check Correlation"
- Section 4 could be "Where to check Correlation"

Mike: Comparing bench measured I/V against raw IBIS data is useful
- Bob: Moshiul does this with scaling

Next meeting will be Apr 13

Meeting ended at 12:15 PM Eastern Time.